Atomic force microscopy, or AFM, is a widely used technique that can quantitatively map material surfaces in three dimensions, but its accuracy is limited by the size of the microscope's probe. A new ...

High-speed atomic force microscopy (HS-AFM) is the only experimental technique to directly watch proteins in dynamic action. However, as a surface scanning technique with limited spatial resolution, ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Atomic force microscopy (AFM) has established itself as a pivotal tool for probing the mechanical properties of soft biological tissues, cells and extracellular matrices at nanometre resolution. By ...

Thought LeaderDr. George HeathUniversity Academic FellowUniversity of Leeds In this interview, AZoNano speaks with Dr. George Heath from the University of Leeds, UK, about the fundamental principles ...

Atomic force microscopy (AFM) is a way to investigate the surface features of some materials. It works by “feeling” or “touching” the surface with an extremely small probe. This provides a ...

Atomic force microscopy (AFM) is a high-resolution imaging technique that generates 3D images of sample surfaces and characterizes their nanomechanical properties. AFM can be used for several ...

(Nanowerk News) Take a photo with your phone and you might see wonderful details—leaves on a tree, strands of hair blowing in the wind. The width of that strand of hair is 100,000 nanometers wide. The ...

Christoph Gerber, who co-invented the atomic force microscope, tells Matthew Chalmers how the AFM came about 30 years ago and why it continues to shape research at the nanoscale Nano-vision Christoph ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...